Specialty devices are the unsung heroes of modern life. For many in the semiconductor industry today, the spotlight is on the SiC and GaN power devices used in automotive, green energy, fast-charge ...

Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

A globally secure remote connectivity framework leveraging existing technologies (IPSec, VPN, TLS, SAML 2.0) through a ...

In today’s competitive semiconductor market, revenue growth is often associated with design innovation, process advancements, ...

A digital twin can go big or small. It can represent an entire car or a city, or a subsystem, chip, or even an individual process under a combination of workloads or conditions, and all of this before ...

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

The high power density in turn produces large thermal gradients, with the low to max temperature changes increasing dramatically in both mission mode and test mode as process geometries shrink, as ...

A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.

Engineers leverage both device-specific and tool-level data to identify a process “sweet spot.” Tight, frequent tool-to-tool matching enables greater yield and fab flexibility. Machine learning helps ...

Multi-die design using 2.5D and 3D technologies has emerged as a necessity to keep the pace of innovation. For all their benefits, these projects present new challenges. This post considers monitoring ...

“We have 600 petabytes of data across Intel,” said Aziz Safa, corporate VP & GM Intel Foundry Automation at the recent PDF Solutions Users Conference. “The challenge is to be able to run algorithms on ...

Recipe‑based automation for atomic force microscopy (AFM) workflows ensures consistent, repeatable data acquisition, reduces operator dependency, and streamlines complex measurement routines. Bruker’s ...